TY - JOUR
T1 - Electronic circuit reliability modeling
AU - Bernstein, Joseph B.
AU - Gurfinkel, Moshe
AU - Li, Xiaojun
AU - Walters, Jörg
AU - Shapira, Yoram
AU - Talmor, Michael
PY - 2006/12
Y1 - 2006/12
N2 - The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review includes historical background as well as a new approach for accurately predicting circuit reliability and failure rate from the system point of view.
AB - The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review includes historical background as well as a new approach for accurately predicting circuit reliability and failure rate from the system point of view.
UR - http://www.scopus.com/inward/record.url?scp=33748937377&partnerID=8YFLogxK
U2 - 10.1016/j.microrel.2005.12.004
DO - 10.1016/j.microrel.2005.12.004
M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???
AN - SCOPUS:33748937377
SN - 0026-2714
VL - 46
SP - 1957
EP - 1979
JO - Microelectronics Reliability
JF - Microelectronics Reliability
IS - 12
ER -