Efficient charge-breeding of helium-6 in an EBIT for precision measurement of the beta-neutrino correlation

M. Schmidt, M. Hass, G. Zschornack, M. L. Rappaport, O. Heber, A. Prygarin, Y. Shachar, S. Vaintraub

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

The precise determination of the beta-neutrino correlation in the decay of radioactive nuclei is an important tool in the effort to probe fundamental interactions for possible deviation from the Standard Model of particles and fields. In order to realize this, a novel scheme for precision measurement of such correlation in the decay of radioactive helium-6 (half-life 0.8 s) using an electrostatic ion beam trap (EIBT) is being constructed at the Weizmann Institute. Efficient ionization of the expected weak flux of helium-6, together with a bunching characteristic suitable for injection into the EIBT, is thereby essential. Both of these requirements are optimally met by an electron beam ion source/trap (EBIT). In this contribution we present the design of a modified DREEBIT (Dresden EBIT) featuring a direct, nearly closed gas intake into the drift tube assembly for maximum trapping and ionization efficiency for low flux rates, without diminishing the bunching phase space of the EBIT. First tests already indicate significant ion production at a minimal gas flow rate observable by a marginal pressure increase that is close to the detection limit of a Leybold extractor gauge located in close proximity to the drift tube assembly. This is a necessary precondition in order to exploit even tiny amounts of rare isotopes.

Original languageEnglish
Title of host publicationProceedings of the XII International Symposium on Electron Beam Ion Sources and Traps, EBIST 2014
EditorsThomas M. Baumann, Stefan Schwarz, Alain Lapierre
Pages149-153
Number of pages5
ISBN (Electronic)9780735412798
DOIs
StatePublished - 2015
Externally publishedYes
Event12th International Symposium on Electron Beam Ion Sources and Traps, EBIST 2014 - East Lansing, United States
Duration: 18 May 201421 May 2014

Publication series

NameAIP Conference Proceedings
Volume1640
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference12th International Symposium on Electron Beam Ion Sources and Traps, EBIST 2014
Country/TerritoryUnited States
CityEast Lansing
Period18/05/1421/05/14

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