Fingerprint
Dive into the research topics of 'Effect of stress interruption and pulsed biased stress on ultra-thin gate dielectric reliability'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Effect of stress interruption and pulsed biased stress on ultra-thin gate dielectric reliability
Bin Wang, J. S. Suehle, E. M. Vogel, J. B. Bernstein
Research output: Contribution to conference › Paper › peer-review
6
Scopus
citations