Abstract
A new technique is proposed to extract long-term constant voltage stress time-dependent dielectric breakdown (TDDB) acceleration parameters from highly accelerated constant or ramped current injection breakdown tests. It is demonstrated that an accurate correlation of highly accelerated breakdown tests to long-term constant voltage TDDB tests can be obtained.
| Original language | English |
|---|---|
| Pages (from-to) | 87-91 |
| Number of pages | 5 |
| Journal | Annual Proceedings - Reliability Physics (Symposium) |
| State | Published - 1998 |
| Externally published | Yes |
| Event | Proceedings of the 1998 36th IEEE International Reliability Physics Symposium - Reno, NV, USA Duration: 31 Mar 1998 → 2 Apr 1998 |