Classification and cost estimation of WIP bubbles in a fab

Michael Hassoun; Gad Rabinowitz; Shlomi Lachs

doi:10.1109/issm.2005.1513368

Classification and cost estimation of WIP bubbles in a fab

Michael Hassoun, Gad Rabinowitz, Shlomi Lachs

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

The purpose of this article is to define and quantify the bubble phenomenon in a semiconductors fab. A "local bubble" is a relatively acute local and temporal WIP congestion. The local bubble is empirically identified and its impact on the local cycle time distribution is assessed. We then estimate its marginal impact on the overall line cycle time and cost. Finally, a novel visualization of the bubble progression is proposed.

Original language	English
Article number	MC191
Pages (from-to)	323-326
Number of pages	4
Journal	IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings
DOIs	https://doi.org/10.1109/issm.2005.1513368
State	Published - 2005
Externally published	Yes
Event	IEEE International Symposium on Semiconductor Manufacturing, Conference Proceedings - San Jose, CA, United States Duration: 13 Sep 2005 → 15 Sep 2005

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10.1109/issm.2005.1513368

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Classification and cost estimation of WIP bubbles in a fab

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