Classification and cost estimation of WIP bubbles in a fab

Michael Hassoun, Gad Rabinowitz, Shlomi Lachs

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations


The purpose of this article is to define and quantify the bubble phenomenon in a semiconductors fab. A "local bubble" is a relatively acute local and temporal WIP congestion. The local bubble is empirically identified and its impact on the local cycle time distribution is assessed. We then estimate its marginal impact on the overall line cycle time and cost. Finally, a novel visualization of the bubble progression is proposed.

Original languageEnglish
Article numberMC191
Pages (from-to)323-326
Number of pages4
JournalIEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings
StatePublished - 2005
Externally publishedYes
EventIEEE International Symposium on Semiconductor Manufacturing, Conference Proceedings - San Jose, CA, United States
Duration: 13 Sep 200515 Sep 2005


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