Characteristics of indium oxide films prepared by DC magnetron sputtering

A. Axelevitch, E. Rabinovitch, G. Golan

Research output: Contribution to conferencePaperpeer-review

Abstract

Highly conductive transparent indium oxide (In2O3) thin films were prepared by DC magnetron sputtering using pure indium oxide targets. Sputtering was done in a pure Argon (Ar) atmosphere with a residual pressure of less than 4 × 10-5 Torr. The substrate temperature was varied during the sputtering process from room temperature to 250°C. Some of the In2O3 samples were given a post-deposition heat treatment while still in vacuum. The indium oxide films were deposited on borosilicate glass plates 0.13÷0.17 mm thick and on optical slide glasses 1 mm thick. The resultants films were characterized for their optical, electrical and mechanical properties. Results show that films with resistivity as low as 2.7×10-3 Ωcm, and transmittance as high as 92% in the visible range (400 ÷ 650 nm) can be obtained by gaining a complete control on the process parameters. A variance in the electrical, mechanical and optical properties of the In2O3 films was found in layers made on borosilicate glass substrates.

Original languageEnglish
Pages448-451
Number of pages4
StatePublished - 1996
Externally publishedYes
EventProceedings of the 1996 19th Convention of Electrical and Electronics Engineers in Israel - Jerusalem, Isr
Duration: 5 Nov 19966 Nov 1996

Conference

ConferenceProceedings of the 1996 19th Convention of Electrical and Electronics Engineers in Israel
CityJerusalem, Isr
Period5/11/966/11/96

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