Atomic force microscopy investigation of dislocation structures and deformation characteristics in neutron irradiated silicon detectors

G. Golan, E. Rabinovich, A. Inberg, A. Axelevitch, M. Oksman, Y. Rosenwaks, A. Kozlovsky, P. J. Rancoita, M. Rattagi, A. Seidman, N. Croitoru

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Engineering

Material Science