Atomic force microscopy investigation of dislocation structures and deformation characteristics in neutron irradiated silicon detectors
G. Golan, E. Rabinovich, A. Inberg, A. Axelevitch, M. Oksman, Y. Rosenwaks, A. Kozlovsky, P. J. Rancoita, M. Rattagi, A. Seidman, N. Croitoru
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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