TY - CHAP
T1 - Applied Engineering on Physics-of-Healthy and SHM of Microelectronic Equipment for Aeronautic, Space, Automotive and Transport Operations
AU - Bensoussan, Alain
AU - Bernstein, Joseph B.
AU - Bravaix, Alain
N1 - Publisher Copyright:
© ISTE Ltd 2022.
PY - 2022/1/1
Y1 - 2022/1/1
N2 - Failure mode and effect analysis is a method for reliability analysis that tries to assess and identify existing failure modes of a system. This chapter presents a case study on application for automotive and aerospace. It shows how the activation energy is related to the stress and temperature applied and proof that the activation energy can no longer be considered as constant to extrapolate some experiment under high stress to nominal mission operation. A predictor is an in situ measurable and quantifiable electrical parameter used to assess the healthiness of a component introduced in equipment. The chapter provides an overview on how to conduct the prognostic failure model methodology applied to a specific industrial case. It presents a method for predicting the failure rate, and thus the reliability of an electronic system by summing the failure rate of each known failure mechanism.
AB - Failure mode and effect analysis is a method for reliability analysis that tries to assess and identify existing failure modes of a system. This chapter presents a case study on application for automotive and aerospace. It shows how the activation energy is related to the stress and temperature applied and proof that the activation energy can no longer be considered as constant to extrapolate some experiment under high stress to nominal mission operation. A predictor is an in situ measurable and quantifiable electrical parameter used to assess the healthiness of a component introduced in equipment. The chapter provides an overview on how to conduct the prognostic failure model methodology applied to a specific industrial case. It presents a method for predicting the failure rate, and thus the reliability of an electronic system by summing the failure rate of each known failure mechanism.
KW - Activation energy
KW - Aerospace industries
KW - Automotive applications
KW - Microelectronic equipment
KW - Nominal mission operation
KW - Prognostic failure model
KW - Transport operations
UR - http://www.scopus.com/inward/record.url?scp=85217298249&partnerID=8YFLogxK
U2 - 10.1002/9781394186068.ch2
DO - 10.1002/9781394186068.ch2
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AN - SCOPUS:85217298249
SN - 9781786308818
SP - 65
EP - 137
BT - Reliability and Physics-of-Healthy in Mechatronics
ER -