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Analysis of transients in semiconductor/semi-insulator junctions
S. Maimon
,
S. E. Schacham
Research output
:
Contribution to journal
›
Article
›
peer-review
1
Scopus citations
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Keyphrases
Semiconductors
100%
Insulator
100%
Fully Depleted
50%
Partially Depleted
33%
Deep Traps
33%
Conductance
16%
Energy Gap
16%
Large Current
16%
Conduction Band
16%
Reverse Bias
16%
Electron Lifetime
16%
Narrow Region
16%
Energy Space
16%
Current Transient
16%
Transient Behavior
16%
Free Carriers
16%
Emission Coefficient
16%
Band Gap
16%
Capture Coefficient
16%
Semi-insulating Substrate
16%
Epitaxial
16%
Conducting Path
16%
Epilayer
16%
Small Current
16%
Epitaxial Layers
16%
Material Science
Epilayers
100%
Epitaxial Film
100%