A study of scaling effects on DRAM reliability

Keyphrases

• Scale Effect 100%
• DRAM Reliability 100%
• Retention Time 66%
• Failure Rate 66%
• Weibull Slope 66%
• Soft Error 66%
• High Temperature 33%
• Randomly Distributed 33%
• Activation Energy 33%
• Downscaling 33%
• Reliability Rate 33%
• Accelerated Stress Test 33%
• Multiple Failure Mechanisms 33%
• Stress Temperature 33%
• Reliability Performance 33%
• Time Variation 33%
• After High Temperature 33%
• Tail Distribution 33%
• Operating Current 33%
• Technology Generation 33%
• Weak Bit 33%
• Progressive Technologies 33%
• Memory Module 33%
• Degradation Trend 33%
• DRAM Errors 33%
• Accelerated Stress 33%
• Retention Time Degradation 33%
• Double Data Rate 33%
• Cell Retention 33%
• Equivalent Stress 33%
• Synchronous Dynamic Random Access Memory (SDRAM) 33%

Engineering

• Retention Time 100%
• Failure Rate 66%
• Soft Error 66%
• Activation Energy 33%
• Failure Mechanism 33%
• Data Rate 33%
• Temperature Stress 33%
• Generation Technology 33%
• Dynamic Random Access Memory 33%
• Equivalent Stress 33%