@inproceedings{a8b968b55ecd474c963cbb4ccb86fb90,
title = "A reliability evaluation methodology for memory chips for space applications when sample size is small",
abstract = "This paper presents a reliability evaluation methodology to obtain the statistical reliability evaluation methodology to obtain the statistical reliability information of memory chips for space applications when the test sample size needs to be kept small because of the high cost of the radiation hardness memories. This methodology can be also used to generate overdriving guidelines and characterize production lines in commercial applications and to obtain de-rating guidelines in space applications.",
keywords = "Acceleration, Costs, Educational institutions, Guidelines, Production, Reliability engineering, Space missions, Space technology, Testing, Voltage",
author = "Y. Chen and D. Nguyen and S. Guertin and J. Bernstein and M. White and R. Menke and S. Kayali",
note = "Publisher Copyright: {\textcopyright} 2003 IEEE.; 2003 IEEE International Integrated Reliability Workshop, IRW 2003 ; Conference date: 20-10-2003 Through 23-10-2003",
year = "2003",
doi = "10.1109/IRWS.2003.1283307",
language = "אנגלית",
series = "IEEE International Integrated Reliability Workshop Final Report",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "91--94",
booktitle = "2003 IEEE International Integrated Reliability Workshop Final Report, IRW 2003",
address = "ארצות הברית",
}