Abstract
Based on previous results showing the tradeoff existing between cycle time (CT) and yield in fabs we propose to dynamically set the control limits of the statistical process control. The limits are determined based on the current level of congestion. We study both a single station and a simple multiple station transfer line and show that the resulting operating points are vastly better in terms of CT, while keeping the yield loss at acceptable levels.
Original language | English |
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Article number | 7592402 |
Pages (from-to) | 32-38 |
Number of pages | 7 |
Journal | IEEE Transactions on Semiconductor Manufacturing |
Volume | 30 |
Issue number | 1 |
DOIs | |
State | Published - Feb 2017 |
Keywords
- Semiconductor manufacturing
- metrology
- statistical process control