A new method to detect geometrical information by the tunneling microscope

Shuichi Tasaki; Jacob Levitan; Jesper Mygind

doi:10.1063/1.366215

A new method to detect geometrical information by the tunneling microscope

Shuichi Tasaki, Jacob Levitan, Jesper Mygind

Department of Physics

Research output: Contribution to journal › Article › peer-review

Abstract

A new method for the detection of the geometrical information by the scanning tunneling microscope is proposed. In addition to the bias voltage, a small ac modulation is applied. The nonlinear dependence of the transmission coefficient on the applied voltage is used to generate harmonics. The ratio of the harmonics to the dc current is found to give the width between the sample and the probe, i.e., the geometrical information. This method may be useful to measure materials, where the local-spatial-density of states may change notably from place to place.

Original language	English
Pages (from-to)	4148-4152
Number of pages	5
Journal	Journal of Applied Physics
Volume	82
Issue number	9
DOIs	https://doi.org/10.1063/1.366215
State	Published - 1 Nov 1997

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A new method to detect geometrical information by the tunneling microscope

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