@inproceedings{48c31094d02a4b05b7d9141add5ee084,
title = "Validation of simulated integrated circuit reliability in conjunction with field data",
abstract = "A thorough reliability analysis of integrated circuit field failure data, recorded from 2002 to 2009, is utilized in order to generate real failure rates for various device process technologies and feature sizes (or {"}technology nodes{"}). The results of this analysis are used to verify Physics-of-Failure (PoF) models and a competing failure approach, as implemented in a new reliability prediction methods - FaRBS (Failure Rate Based Simulation Program with Integrated Circuit Emphasis). Comparison of the simulated and the actual field failure rates demonstrate that the simulation agrees very well with the field failure and a strong correlation of 80\% is achieved.",
keywords = "Failure Rate, Integrated Circuit, Physics-of-Failure, Reliability",
author = "Avshalom Hava and Jin Qin and Bernstein, \{Joseph B.\}",
year = "2011",
language = "אנגלית",
isbn = "9781617829512",
series = "Proceedings of the 2011 - Grand Challenges in Modeling and Simulation Conference, GCMS 2011",
pages = "362--369",
booktitle = "Proceedings of the 2011 - Grand Challenges in Modeling and Simulation Conference, GCMS 2011",
note = "4th Grand Challenges in Modeling and Simulation Conference, GCMS 2011 ; Conference date: 27-06-2011 Through 30-06-2011",
}