TY - GEN
T1 - THz characterization of lossy materials using multi-layers measuring cell
AU - Kapilevich, B.
AU - Pinhasi, Y.
AU - Yahalom, A.
AU - Litvak, B.
PY - 2008
Y1 - 2008
N2 - A method of measurement of the real and imaginary parts of thin-layer materials at THz frequencies is described. The method is based on application of multi-layers measuring cell consisting of unknown lossy slab and the slabs of low loss material with known dielectric constant. The recorded power transmittance interferogram is employed for reconstructing the complex permittivity of a material under test. Reconstructing algorithm based on solution of the system of non-linear equations is proposed. The example of characterization of the thin lossy sample such as a paper sheet of thickness 0.1 mm in 0.8-1.1 THz is reported.
AB - A method of measurement of the real and imaginary parts of thin-layer materials at THz frequencies is described. The method is based on application of multi-layers measuring cell consisting of unknown lossy slab and the slabs of low loss material with known dielectric constant. The recorded power transmittance interferogram is employed for reconstructing the complex permittivity of a material under test. Reconstructing algorithm based on solution of the system of non-linear equations is proposed. The example of characterization of the thin lossy sample such as a paper sheet of thickness 0.1 mm in 0.8-1.1 THz is reported.
UR - https://www.scopus.com/pages/publications/58049123343
U2 - 10.1109/ICIMW.2008.4665710
DO - 10.1109/ICIMW.2008.4665710
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AN - SCOPUS:58049123343
SN - 9781424421206
T3 - 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008
BT - 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008
T2 - 33rd International Conference on Infrared and Millimeter Waves and the 16th International Conference on Terahertz Electronics, 2008, IRMMW-THz 2008
Y2 - 15 September 2008 through 19 September 2008
ER -