Synopsis of multiphysics deep sub-micron failure rate modeling technique for CFR and EOL prediction

Keyphrases

• Modeling Techniques 100%
• Failure Mechanism 100%
• Failure Rate Modeling 100%
• Multiphysics 100%
• Deep Submicron 100%
• Stochastic Optical Reconstruction Microscopy (STORM) 75%
• High Temperature 50%
• Transition State Theory 25%
• Working Conditions 25%
• Stress Conditions 25%
• Reliability Model 25%
• Testing Method 25%
• Reliability Prediction 25%
• Device Sizing 25%
• Bernstein 25%
• Testing Procedures 25%
• Device Performance 25%
• Failure Model 25%
• Arrhenius Law 25%
• Multiple Stressors 25%
• Reliability Method 25%
• Process Flow 25%
• Ludwig Boltzmann 25%
• Design Reliability 25%
• Subzero 25%
• Accelerated Reliability Test 25%
• Intrusive Measurement 25%
• Arrhenius 25%
• Multi-stressors 25%
• Competing Failure 25%

Engineering

• Failure Rate 100%
• Failure Mechanism 100%
• Stress Condition 25%
• Field Programmable Gate Arrays 25%
• Testing Method 25%
• Reliability Analysis 25%
• Failure Model 25%
• Process Flow 25%
• Arrhenius 25%
• Design for Reliability 25%
• Reliability Method 25%
• Device Performance 25%
• Arrhenius Law 25%
• Boltzmann Model 25%