ملخص
A method for polarimetric measurement that uses a discrete space-variant subwavelength dielectric grating is presented. One retrieves the polarization state by measuring the far-field intensity of a beam emerging from the grating followed by a polarizer. The analysis for a partially polarized, quasi-monochromatic beam is performed by use of the beam coherence polarization matrix along with an extended van Cittert-Zernike theorem. We experimentally demonstrate polarization measurements of both fully and partially polarized light.
اللغة الأصلية | الإنجليزيّة |
---|---|
الصفحات (من إلى) | 2245-2247 |
عدد الصفحات | 3 |
دورية | Optics Letters |
مستوى الصوت | 30 |
رقم الإصدار | 17 |
المعرِّفات الرقمية للأشياء | |
حالة النشر | نُشِر - 1 سبتمبر 2005 |
منشور خارجيًا | نعم |