New technique to extract TDDB acceleration parameters from fast Qbd tests

Yuan Chen; John S. Suehle; Bruce Shen; Joseph Bernstein; Cleston Messick; Prasad Chaparala

New technique to extract TDDB acceleration parameters from fast Q_bd tests

Yuan Chen
, John S. Suehle
, Bruce Shen
, Joseph Bernstein
, Cleston Messick
, Prasad Chaparala

نتاج البحث: نتاج بحثي من مؤتمر › محاضرة › مراجعة النظراء

ملخص

A new technique is proposed to extract long-term constant voltage stress time-dependent dielectric breakdown (TDDB) acceleration parameters from highly accelerated constant current injection breakdown tests. This is the first time that an accurate correlation of the highly accelerated breakdown tests to long-term TDDB tests has been presented.

اللغة الأصلية	الإنجليزيّة
الصفحات	67-69
عدد الصفحات	3
حالة النشر	نُشِر - 1997
منشور خارجيًا	نعم
الحدث	Proceedings of the 1997 IEEE International Integrated Reliability Workshop - Tahoe, CA, USA المدة: 13 أكتوبر 1997 → 16 أكتوبر 1997

!!Conference

!!Conference	Proceedings of the 1997 IEEE International Integrated Reliability Workshop
المدينة	Tahoe, CA, USA
المدة	13/10/97 → 16/10/97

الملفات والروابط الأخرى

Link to publication in Scopus

قم بذكر هذا

@conference{d7af6cab6ca04819871af5e7a16ef324,

title = "New technique to extract TDDB acceleration parameters from fast Qbd tests",

abstract = "A new technique is proposed to extract long-term constant voltage stress time-dependent dielectric breakdown (TDDB) acceleration parameters from highly accelerated constant current injection breakdown tests. This is the first time that an accurate correlation of the highly accelerated breakdown tests to long-term TDDB tests has been presented.",

author = "Yuan Chen and Suehle, \{John S.\} and Bruce Shen and Joseph Bernstein and Cleston Messick and Prasad Chaparala",

year = "1997",

language = "אנגלית",

pages = "67--69",

note = "Proceedings of the 1997 IEEE International Integrated Reliability Workshop ; Conference date: 13-10-1997 Through 16-10-1997",

}

New technique to extract TDDB acceleration parameters from fast Q_bd tests. / Chen, Yuan; Suehle, John S.; Shen, Bruce وآخرون.
1997. 67-69 الأوراق المقدمة في Proceedings of the 1997 IEEE International Integrated Reliability Workshop, Tahoe, CA, USA.

نتاج البحث: نتاج بحثي من مؤتمر › محاضرة › مراجعة النظراء

TY - CONF

T1 - New technique to extract TDDB acceleration parameters from fast Qbd tests

AU - Chen, Yuan

AU - Suehle, John S.

AU - Shen, Bruce

AU - Bernstein, Joseph

AU - Messick, Cleston

AU - Chaparala, Prasad

PY - 1997

Y1 - 1997

N2 - A new technique is proposed to extract long-term constant voltage stress time-dependent dielectric breakdown (TDDB) acceleration parameters from highly accelerated constant current injection breakdown tests. This is the first time that an accurate correlation of the highly accelerated breakdown tests to long-term TDDB tests has been presented.

AB - A new technique is proposed to extract long-term constant voltage stress time-dependent dielectric breakdown (TDDB) acceleration parameters from highly accelerated constant current injection breakdown tests. This is the first time that an accurate correlation of the highly accelerated breakdown tests to long-term TDDB tests has been presented.

UR - https://www.scopus.com/pages/publications/0031370126

M3 - ???researchoutput.researchoutputtypes.contributiontoconference.paper???

AN - SCOPUS:0031370126

SP - 67

EP - 69

T2 - Proceedings of the 1997 IEEE International Integrated Reliability Workshop

Y2 - 13 October 1997 through 16 October 1997