Investigation of metal-silicon interface influenced by Vacuum Photothermal Processing (VPP)

G. Golan, A. Chorny, L. Kranovich, A. Axelevitch

نتاج البحث: نتاج بحثي من مؤتمرمحاضرةمراجعة النظراء

2 اقتباسات (Scopus)

ملخص

Vacuum Photothermal Processing (VPP) constitutes a simultaneous irradiation of a treated sample in a vacuum chamber with electron flux and non-coherent light, mainly UV and VUV spectrum. In the present work we have studied the influence of VPP on the interface between a silicon substrate and a metal coating deposited on this substrate. It was found that the VPP provides for stabilizing the deposited coatings, improves homogeneity, and cures irreversible electrical breakdown in thin-film systems; it was also found to improve the roughness of interfaces between semiconductor and metal coatings. All of these modifications and improvements are explained by the appearance of an intermediate layer which was born up while VPP, passivaiting the interface. This built-in layer, is presented in our study.

اللغة الأصليةالإنجليزيّة
الصفحات425-428
عدد الصفحات4
حالة النشرنُشِر - 2004
منشور خارجيًانعم
الحدثProceedings - 2004 24th International Conference on Microelectronics, MIEL 2004 - Nis
المدة: ١٦ مايو ٢٠٠٤١٩ مايو ٢٠٠٤

!!Conference

!!ConferenceProceedings - 2004 24th International Conference on Microelectronics, MIEL 2004
المدينةNis
المدة١٦/٠٥/٠٤١٩/٠٥/٠٤

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