@article{40f97c8d536c43c990b59493bcf86837,
title = "Hunting down the bubble makers in fabs",
abstract = "Based on a simulated Non Volatile Memory fab, we employ data-mining to identify and quantify the apparent causes of work in process bubbles along the process. The chosen bubble formalization methods proved able to detect the phenomenon and enabled its occurrence frequency to be forecasted. In the chosen environment, bubbles seem to be highly correlated with the utilization patterns of the process segment considered.",
keywords = "Congestion, Production management, Semiconductors, Work-in-process",
author = "M. Hassoun and G. Rabinowitz",
note = "Funding Information: Manuscript received November 18, 2008; revised August 14, 2009; accepted November 20, 2009. First published December 22, 2009; current version published February 03, 2010. This work was supported in part by the Intel Corporation. The authors are with the Industrial Engineering and Management Department, Ben Gurion University of the Negrev, Beer Sheva 84105, Israel. Digital Object Identifier 10.1109/TSM.2009.2039244",
year = "2010",
month = feb,
doi = "10.1109/TSM.2009.2039244",
language = "אנגלית",
volume = "23",
pages = "13--20",
journal = "IEEE Transactions on Semiconductor Manufacturing",
issn = "0894-6507",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "1",
}