Hardware error likelihood induced by the operation of software

Keyphrases

• Error Likelihood 100%
• Hardware Failure 100%
• Reliability Analysis 66%
• Interdependency 33%
• Functional Change 33%
• Voltage-current 33%
• Current Flow 33%
• Semiconductor Devices 33%
• Deep Submicron 33%
• Software Operation 33%
• Permanent Failure 33%
• Signal Delay 33%
• Voltage Change 33%
• Safety-critical Applications 33%
• Transient Failure 33%
• Software Application 33%
• Circuit Level 33%
• System Lifetime 33%
• Safety-critical Systems 33%
• Hardware Devices 33%
• Stuck-at 33%
• Complementary Metal-oxide-semiconductor Technology 33%
• Embedded Software 33%
• Intended Function 33%

Computer Science

• Hardware Failure 100%
• Computer Hardware 100%
• Case Study 50%
• Critical Application 50%
• Interdependency 50%
• Software Application 50%
• Embedded Software 50%
• Intended Function 50%
• Hardware Device 50%
• Safety Critical Systems 50%
• Complementary Metal Oxide Semiconductor 50%

Engineering

• Reliability Analysis 100%
• Transients 50%
• Semiconductor Device 50%
• Complementary Metal-Oxide-Semiconductor 50%
• Interdependency 50%
• Software Application 50%
• Critical System 50%
• Critical Application 50%
• Current Flow 50%