Femtometer-resolved wavelength monitor based on photodiode optoelectronic chromatic dispersion with RF phase-shift amplification

The spectral sensitivity of photodiode-based optoelectronic chromatic dispersion is enhanced by phase-shift amplification using RF interferometry. With phase-shift amplification of G = 4 · 10⁴, a peak phase-shift sensitivity of ∆θ = 27 deg/pm is achieved, corresponding to a spectral resolution of ∆λ_res = 1 fm. This all-electronic solid-state technology can serve as an on-chip inexpensive technique for femtometer-resolved wavelength monitoring.