Electronic circuit reliability modeling

Joseph B. Bernstein; Moshe Gurfinkel; Xiaojun Li; Jörg Walters; Yoram Shapira; Michael Talmor

doi:10.1016/j.microrel.2005.12.004

Electronic circuit reliability modeling

Joseph B. Bernstein
, Moshe Gurfinkel
, Xiaojun Li
, Jörg Walters
, Yoram Shapira
, Michael Talmor

نتاج البحث: نشر في مجلة › مقالة › مراجعة النظراء

154 اقتباسات (Scopus)

ملخص

The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review includes historical background as well as a new approach for accurately predicting circuit reliability and failure rate from the system point of view.

اللغة الأصلية	الإنجليزيّة
الصفحات (من إلى)	1957-1979
عدد الصفحات	23
دورية	Microelectronics Reliability
مستوى الصوت	46
رقم الإصدار	12
المعرِّفات الرقمية للأشياء	https://doi.org/10.1016/j.microrel.2005.12.004
حالة النشر	نُشِر - ديسمبر 2006
منشور خارجيًا	نعم

الوصول إلى المستند

10.1016/j.microrel.2005.12.004

الملفات والروابط الأخرى

Link to publication in Scopus

قم بذكر هذا

@article{8b33eec003904367843cafb696e49b5c,

title = "Electronic circuit reliability modeling",

abstract = "The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review includes historical background as well as a new approach for accurately predicting circuit reliability and failure rate from the system point of view.",

author = "Bernstein, \{Joseph B.\} and Moshe Gurfinkel and Xiaojun Li and J{\"o}rg Walters and Yoram Shapira and Michael Talmor",

year = "2006",

month = dec,

doi = "10.1016/j.microrel.2005.12.004",

language = "אנגלית",

volume = "46",

pages = "1957--1979",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd.",

number = "12",

}

TY - JOUR

T1 - Electronic circuit reliability modeling

AU - Bernstein, Joseph B.

AU - Gurfinkel, Moshe

AU - Li, Xiaojun

AU - Walters, Jörg

AU - Shapira, Yoram

AU - Talmor, Michael

PY - 2006/12

Y1 - 2006/12

N2 - The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review includes historical background as well as a new approach for accurately predicting circuit reliability and failure rate from the system point of view.

AB - The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review includes historical background as well as a new approach for accurately predicting circuit reliability and failure rate from the system point of view.

UR - https://www.scopus.com/pages/publications/33748937377

U2 - 10.1016/j.microrel.2005.12.004

DO - 10.1016/j.microrel.2005.12.004

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.article???

AN - SCOPUS:33748937377

SN - 0026-2714

VL - 46

SP - 1957

EP - 1979

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 12

ER -

Electronic circuit reliability modeling

ملخص

الوصول إلى المستند

الملفات والروابط الأخرى

بصمة

قم بذكر هذا