Dielectric properties of UV-irradiated ultrathin polysulfone films revealed by surface plasmon resonance method

Roman Pogreb, Viktor Danchuk, Gene Whyman

نتاج البحث: نشر في مجلةمقالةمراجعة النظراء

2 اقتباسات (Scopus)

ملخص

The surface plasmon resonance research of manufactured highly homogeneous ultrathin polysulfone films was performed, which were exposed to the short-wave (254 nm) UV irradiation of various durations. Surprisingly, the resonance incident angle and dielectric constant increase after short-term UV irradiation before the ordinary decrease caused by usual polymer degradation. The experimental results are ascribed to the formation of polar groups leading to orientation of chain fragments of intermediate length followed by their breaking and formation of mobile short fragments under longer times of irradiation.

اللغة الأصليةالإنجليزيّة
الصفحات (من إلى)396-402
عدد الصفحات7
دوريةInternational Journal of Polymer Analysis and Characterization
مستوى الصوت23
رقم الإصدار4
المعرِّفات الرقمية للأشياء
حالة النشرنُشِر - 19 مايو 2018

بصمة

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