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English
עברית
العربية
الصفحة الرئيسية
الملفات الشخصية
الوحدات البحثية
نتاج البحث
الجوائز
أنشطة
البحث حسب الخبرة أو الاسم أو الانتماء
عرض الملف الشخصي الخاص بـ Scopus
מיכאל חסון
Dr.
Senior Lecturer / Assistant Professor
,
Department of Industrial Engineering and Management
https://orcid.org/0000-0002-3926-261X
2005
2024
نتاج الأبحاث سنويًا
معاينة
بصمة
الشبكة
نتاج البحث
(27)
ملفات شخصية مماثلة
(4)
بصمة
تأتي تسميات الموضوعات هذه من أعمال هذا الشخص. فهما يشكلان معًا بصمة فريدة.
فرز حسب
الوزن
أبجديًا
Keyphrases
Semiconductor Manufacturing
100%
Metrology
64%
Steady State
54%
Control Limits
50%
Metrology Tool
42%
Simulation Model
42%
Congestion
42%
Product Layer
33%
Quality Control Requirements
33%
Key Factors Identification
33%
Local Bubble
33%
Simulation Test Bed
33%
Constant Release
33%
Re-entrant Lines
33%
Cost Estimation
33%
Performance Measures
32%
Decision Maker
30%
Upper Control Limit
28%
State Cycle
25%
Efficient Segmentation
25%
Time Predictability
25%
Segment Characteristics
25%
Cycle Life Prediction
25%
Semiconductor Fab
25%
Marginal Impact
25%
Release Rate
25%
Steady-state Characteristics
25%
Mathematical Description
25%
Dispatching Policies
25%
Periodic Regime
25%
Machine Downtime
25%
Chaotic Regime
25%
Stability Properties
25%
Non-volatile Memory
25%
Time Delay
25%
Performance Metrics
25%
Semiconductor Production Line
22%
Single Station
22%
Stoppages
22%
Partially Observable
22%
Deposition Process
22%
Heterogeneous Machines
21%
Minimizing Risk
21%
Pareto Optimal Set
19%
Single Line
16%
Naïve Bayesian Classifier
16%
Lagrangian Heuristic
16%
Queue Time Constraints
16%
Local Events
16%
Waiting Time Distribution
16%
Engineering
Semiconductor Manufacturing
98%
Control Limit
56%
Production Line
50%
Knapsack Problem
42%
Quality Control
42%
Progression
33%
Cost Estimation
33%
Transients
33%
Performance Measure ψ
31%
Simulation Mode
30%
Bayesian Classifier
25%
Decision Maker
20%
Nonvolatile Memory
16%
Multiple Feasibility
16%
Product Loss
16%
Cycle Cost
16%
Constraint Violation
16%
Release Time
16%
Single Line
16%
Acceptable Level
16%
Dynamic Process
16%
Process Control
16%
Control Scheme
16%
Statistical Process Control
16%
Transfer Stations
16%
Control Strategy
16%
Moving Target
16%
Mutual Information
16%
Control Logic
16%
Operating Point
16%
Maximization
16%
Simulation Model
16%
Greenhouse Gas
16%
Linear Programming
16%
Learning System
16%
Quality Loss
16%
Engineering
16%
Sampling Plan
16%
Deposition Process
14%
Machine Downtime
14%
State Characteristic
14%
Mathematical Description
14%
Release Rate
14%
Metrics
14%
Delay Time
14%
Numerical Experiment
14%
Pareto Optimal Set
12%
Greedy Algorithm
9%
Limiting Value
9%
Manufacturing Plant
8%
