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المساعدة والأسئلة الشائعة
English
עברית
العربية
الصفحة الرئيسية
الملفات الشخصية
الوحدات البحثية
نتاج البحث
الجوائز
أنشطة
البحث حسب الخبرة أو الاسم أو الانتماء
عرض الملف الشخصي الخاص بـ Scopus
גדי גולן
Prof.
Associate Professor
,
Department of Electrical and Electronics Engineering
https://orcid.org/0000-0002-1993-583X
1987 …
2024
نتاج الأبحاث سنويًا
معاينة
بصمة
الشبكة
نتاج البحث
(111)
ملفات شخصية مماثلة
(1)
بصمة
تأتي تسميات الموضوعات هذه من أعمال هذا الشخص. فهما يشكلان معًا بصمة فريدة.
فرز حسب
الوزن
أبجديًا
Material Science
Al2O3
11%
Aluminum
7%
Atomic Force Microscopy
9%
Density
6%
Diamond Like Carbon Films
7%
Dislocation Structure
10%
Electrical Resistivity
16%
Electronic Circuit
19%
Film
55%
Film Thickness
5%
Heterojunction
10%
Indentation
5%
Indium
26%
Magnetron Sputtering
22%
Metal Coating
7%
Microhardness
19%
Neutron Irradiation
8%
Optical Property
12%
Oxide Compound
36%
Oxide Film
15%
Phase Composition
8%
Photovoltaics
17%
Reflectivity
6%
Resonator
10%
Scanning Acoustic Microscopy
7%
Scanning Electron Microscopy
5%
Silicon
46%
Silicon Carbide
7%
Silicon Solar Cell
8%
Silver
5%
Solar Cell
21%
Surface (Surface Science)
30%
Tantalum
7%
Thermoelectrics
7%
Thin Film Coating
8%
Thin Film Growth
5%
Thin Films
100%
Transistor
10%
Tungsten
6%
Vanadium
14%
Waveguide
8%
Keyphrases
Aluminum Oxide
10%
Argon Atmosphere
10%
Argon Pressure
8%
Atomic Force Microscopy
10%
DC Magnetron Sputtering
16%
Dislocation Loops
10%
Dislocation Structure
10%
Electrical Field
10%
Electrical Properties
26%
Electron Beam
10%
Failure Mechanism
10%
Glass Substrate
13%
Heterostructure
10%
In2O3 Thin Film
8%
Indium Oxide
32%
Indium Oxide Thin Films
14%
Langmuir Probe
11%
Low Pressure
18%
Mechanical Properties
9%
Microhardness
17%
Multicrystalline Silicon
8%
Neutron Irradiation
12%
Neutron-irradiated
14%
Novel Types
10%
Optical Properties
16%
P-type
10%
Photothermal
27%
Photovoltaic System
9%
Plasma Discharge
14%
Property Study
8%
Pure Argon
8%
Resistivity
10%
Scanning Acoustic Microscope
8%
Scanning Acoustic Microscopy
14%
Semiconductors
11%
Silicon Detectors
14%
SOI CMOS
8%
Solar Cell
17%
Solar Energy
10%
Sputtering Method
24%
Sputtering Process
12%
Substrate Temperature
10%
Thermal Processing
9%
Thermal Sensor
11%
Thin Systems
13%
Transparent Conductive Coatings
8%
Transparent Conductive Materials
16%
Triode
15%
Vanadium Oxide Thin Film
14%
Vidicon
8%
Engineering
Atomic Force Microscopy
10%
Conductive
25%
Crystalline Silicon
8%
Deformation Characteristic
7%
Deposited Film
12%
Diamond-Like Carbon
7%
Directional Coupler
7%
Dislocation Loop
11%
Dislocation Structure
10%
Electric Field
10%
Emissivity
7%
Failure Mechanism
9%
Field Effect Transistor
7%
Glass Substrate
9%
Harmonics
7%
Heterojunctions
10%
High Resolution
8%
Large-Scale Systems
7%
Magnetic Field
8%
Magnetron
13%
Main Advantage
8%
Maximum Power Point Tracking
7%
Mechanical Model
7%
Microelectronics
9%
Microhardness
19%
Mode Shape
7%
Networks (Circuits)
7%
Phase Composition
9%
Photovoltaic Effect
6%
Photovoltaic System
9%
Photovoltaics
17%
Power Quality
7%
Pressure Range
7%
Reflectance
7%
Resonator
7%
Scanning Acoustic Microscopy
10%
Scanning Electron Microscope
7%
Silicon Substrate
6%
Smart Grid
7%
Solar Cell
22%
Solar Energy
9%
Solar Panel
7%
Substrate Temperature
6%
Surface Acoustic Wave
14%
Thermal Sensor
13%
Thermodynamic System
7%
Thin Film Growth
6%
Thin Films
96%
Transport Mechanism
8%
Waveguide
9%
